A MODEL FOR IMAGE SPLICING (TA-S2)

Author(s) : Tian-Tsong Ng (Department of Electrical Engineering, Columbia University, New York, USA) Shih-Fu Chang (Department of Electrical Engineering, Columbia University, New York, USA)

Abstract : The ease of creating image forgery using image-splicing techniques will soon make our naïve trust on image authenticity a thing of the past. In prior work, we observed the capability of the bicoherence magnitude and phase features for image splicing detection. To bridge the gap between empirical observations and theoretical justifications, in this paper, an image-splicing model based on the idea of bipolar signal perturbation is proposed and studied. A theoretical analysis of the model leads to propositions and predictions consistent with the empirical observations.

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